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SixSense Blog
Revolutionizing Chip Manufacturing: AI-Powered Auto-Defect Classification

This blog explores how SixSense’s AI-powered defect classification system is transforming semiconductor manufacturing by automating visual inspection and error detection. It demonstrates how advanced AI analytics enhance yield, speed, and reliability—minimizing manual bottlenecks and driving smarter, scalable production.

By Shubham Natu | 21st Nov 2025
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